Chemical analysis and distribution investigation of trace elements in indium matrix by spark source mass spectrometry
Identifieur interne : 000601 ( Main/Exploration ); précédent : 000600; suivant : 000602Chemical analysis and distribution investigation of trace elements in indium matrix by spark source mass spectrometry
Auteurs : RBID : ISTEX:216_1987_Article_BF00489156.pdfAbstract
High-purity indium was analysed by spark source mass spectrometry, using electrical and photoplate detection. For the calibration of the differences in elemental sensitivity, a standard sample was prepared in which 10 impurities were determined by graphite furnace atomic absorption spectrometry. In this way accuracies of less than 40% were obtained for relatively homogeneous elements at ppm and sub-ppm level. About 40 elements could be determined with detection limits of 10 to 30 ppb. Two pattern recognition methods, principal component analysis and clustering analysis, were applied to obtain information on trace element distribution, which indicated that a number of elements were strongly spatially correlated in the analysed sample.
DOI: 10.1007/BF00489156
Links toward previous steps (curation, corpus...)
Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title>Chemical analysis and distribution investigation of trace elements in indium matrix by spark source mass spectrometry</title><author><name>X. D. Liu</name><affiliation wicri:level="1"><mods:affiliation>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk, Belgium</mods:affiliation><country xml:lang="fr">Belgique</country><wicri:regionArea>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk</wicri:regionArea><wicri:noRegion>Wilrijk</wicri:noRegion></affiliation></author><author><name>P. Van Espen</name><affiliation wicri:level="1"><mods:affiliation>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk, Belgium</mods:affiliation><country xml:lang="fr">Belgique</country><wicri:regionArea>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk</wicri:regionArea><wicri:noRegion>Wilrijk</wicri:noRegion></affiliation></author><author><name>F. Adams</name><affiliation wicri:level="1"><mods:affiliation>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk, Belgium</mods:affiliation><country xml:lang="fr">Belgique</country><wicri:regionArea>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk</wicri:regionArea><wicri:noRegion>Wilrijk</wicri:noRegion></affiliation></author></titleStmt><publicationStmt><idno type="RBID">ISTEX:216_1987_Article_BF00489156.pdf</idno><date when="1987">1987</date><idno type="doi">10.1007/BF00489156</idno><idno type="wicri:Area/Main/Corpus">000533</idno><idno type="wicri:Area/Main/Curation">000533</idno><idno type="wicri:Area/Main/Exploration">000601</idno></publicationStmt></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="eng">High-purity indium was analysed by spark source mass spectrometry, using electrical and photoplate detection. For the calibration of the differences in elemental sensitivity, a standard sample was prepared in which 10 impurities were determined by graphite furnace atomic absorption spectrometry. In this way accuracies of less than 40% were obtained for relatively homogeneous elements at ppm and sub-ppm level. About 40 elements could be determined with detection limits of 10 to 30 ppb. Two pattern recognition methods, principal component analysis and clustering analysis, were applied to obtain information on trace element distribution, which indicated that a number of elements were strongly spatially correlated in the analysed sample.</div></front></TEI><mods xsi:schemaLocation="http://www.loc.gov/mods/v3 file:///applis/istex/home/loadistex/home/etc/xsd/mods.xsd" version="3.4" istexId="5cb19b150d6100625301448dc80b777c4a246fe4"><titleInfo lang="eng"><title>Chemical analysis and distribution investigation of trace elements in indium matrix by spark source mass spectrometry</title></titleInfo><titleInfo lang="ger"><title>Chemische Analyse und Verteilungsbestimmung von Spurenelementen in Indium-Matrix durch Funkenquellen-Massenspektrometrie</title></titleInfo><name type="personal"><namePart type="given">X. D.</namePart><namePart type="family">Liu</namePart><role><roleTerm type="text">author</roleTerm></role><affiliation>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk, Belgium</affiliation></name><name type="personal"><namePart type="given">P.</namePart><namePart type="family">Van Espen</namePart><role><roleTerm type="text">author</roleTerm></role><affiliation>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk, Belgium</affiliation></name><name type="personal"><namePart type="given">F.</namePart><namePart type="family">Adams</namePart><role><roleTerm type="text">author</roleTerm></role><affiliation>Department of Chemistry, University of Antwerp, UIA., Universiteitsplein 1, B-2610, Wilrijk, Belgium</affiliation></name><typeOfResource>text</typeOfResource><genre>Original Papers</genre><genre>Original Paper</genre><originInfo><publisher>Springer-Verlag, Berlin/Heidelberg</publisher><dateCreated encoding="w3cdtf">1986-09-08</dateCreated><dateValid encoding="w3cdtf">2004-10-04</dateValid><copyrightDate encoding="w3cdtf">1987</copyrightDate></originInfo><language><languageTerm type="code" authority="iso639-2b">eng</languageTerm></language><physicalDescription><internetMediaType>text/html</internetMediaType></physicalDescription><abstract lang="eng">High-purity indium was analysed by spark source mass spectrometry, using electrical and photoplate detection. For the calibration of the differences in elemental sensitivity, a standard sample was prepared in which 10 impurities were determined by graphite furnace atomic absorption spectrometry. In this way accuracies of less than 40% were obtained for relatively homogeneous elements at ppm and sub-ppm level. About 40 elements could be determined with detection limits of 10 to 30 ppb. Two pattern recognition methods, principal component analysis and clustering analysis, were applied to obtain information on trace element distribution, which indicated that a number of elements were strongly spatially correlated in the analysed sample.</abstract><relatedItem type="series"><titleInfo type="abbreviated"><title>Z. Anal. Chem.</title></titleInfo><titleInfo><title>Fresenius' Zeitschrift für analytische Chemie</title><partNumber>Year: 1987</partNumber><partNumber>Volume: 327</partNumber><partNumber>Number: 7</partNumber></titleInfo><genre>Archive Journal</genre><originInfo><dateIssued encoding="w3cdtf">1987-01-01</dateIssued><copyrightDate encoding="w3cdtf">1987</copyrightDate></originInfo><subject usage="primary"><topic>Chemistry</topic><topic>Analytical Chemistry</topic><topic>Food Science</topic><topic>Inorganic Chemistry</topic><topic>Physical Chemistry</topic><topic>Monitoring/Environmental Analysis/Environmental Ecotoxicology</topic></subject><identifier type="issn">0016-1152</identifier><identifier type="issn">Electronic: 1618-2650</identifier><identifier type="matrixNumber">216</identifier><identifier type="local">IssueArticleCount: 31</identifier><recordInfo><recordOrigin>Springer-Verlag, 1987</recordOrigin></recordInfo></relatedItem><identifier type="doi">10.1007/BF00489156</identifier><identifier type="matrixNumber">Art3</identifier><identifier type="local">BF00489156</identifier><accessCondition type="use and reproduction">MetadataGrant: OpenAccess</accessCondition><accessCondition type="use and reproduction">AbstractGrant: OpenAccess</accessCondition><accessCondition type="restriction on access">BodyPDFGrant: Restricted</accessCondition><accessCondition type="restriction on access">BodyHTMLGrant: Restricted</accessCondition><accessCondition type="restriction on access">BibliographyGrant: Restricted</accessCondition><accessCondition type="restriction on access">ESMGrant: Restricted</accessCondition><part><extent unit="pages"><start>659</start><end>664</end></extent></part><recordInfo><recordOrigin>Springer-Verlag, 1987</recordOrigin><recordIdentifier>216_1987_Article_BF00489156.pdf</recordIdentifier></recordInfo></mods></record>Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=IndiumV1/Data/Main/Exploration
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 000601 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd -nk 000601 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien
|wiki= *** parameter Area/wikiCode missing ***
|area= IndiumV1
|flux= Main
|étape= Exploration
|type= RBID
|clé= ISTEX:216_1987_Article_BF00489156.pdf
|texte= Chemical analysis and distribution investigation of trace elements in indium matrix by spark source mass spectrometry
}}
| This area was generated with Dilib version V0.5.81. |  |